About me

SciCaTec - Dr. Markus Jäger
Since 2006 I have been working in the field of embedded systems and FPGA SoC development, specializing in the implementation of signal, video and image processing and specific algorithms. As a system architect, I have been involved since 2010 in the conception and specification of complete electronic systems, which should meet special data processing requirements such as high throughput and low latency. The resulting concepts and implementations are mostly innovative. I gain my development experience in the industrial as well as in the scientific area. Since 2011, in addition to my full-time activities in the industrial field, I have been working as a scientist. Here I have developed scientific measurement instruments for nuclear electronic applications. One of them is now used in the CERN/ISOLDE nuclear research institution.
Please see below for an overview of my professional competencies.
Key Competencies
    • FPGA SoC Development
      • Implementation of Signal, Video, Image Processing and specific algorithms
      • Adaptive, reusable and extensible system architectures
      • Optimization of throughput and latency for specific technology
      • Reliable Clock Domain Crossing (CDC) and acquisition of asynchronous signals
      • Development experience with Xilinx (ISE, EDK, Vivado, Vivado HLS), Intel (Quartus Prime), Lattice (ispLEVER, Diamond)
      • Simulation and functional verification with ModelSim
    • Video and Image Processing
      • Algorithms such as: DeBayer, standard ISP, Dead Pixel Correction, High Dynamic Range (HDR), digital Image Stabilization, Color Correction, Autofocus, Image Sharpness, Image Fusion, Extended Depth of Field (EDoF), FFT, DWT
      • Building modern video processing pipelines
    • Signal Processing
      • digital filters especially SuperSampleRate-FIR/IIR filters
      • high resolution time measurement in ADC-SubSample range (relevant for LiDAR, Time of Flight (ToF))
      • high resolution signal amplitude determination
      • noise shaping, oversampling and signal enhancement
      • different types of Time-to-Digital Conversion (TDC) (relevant for LiDAR, Time of Flight (ToF))
      • Acquisition and processing of detector signals (Pulse Shaping)
    • FPGA SoC Technology
      • Xilinx (Zynq Ultrascale+ MPSoC, Kintex, Artix, Virtex, Spartan)
      • Intel (Stratix, Cyclon)
      • Lattice (MachXO2, CrossLink)
      • Multi-gigabit Transceiver (MGT)
    • Camera and image sensors
      • CCD, CMOS image sensors and line sensors
      • Direct connection of image sensors to FPGA technology
      • Camera modules incl. ISP and interfaces like USB3, MIPI, LVDS, Camera Link
    • Interfaces and Communication
      • for memory: DDR SDRAM, SRAM, Flash
      • for GigaSample ADC: LVDS, JESD, Parallel
      • for bus systems: PCI, PCIe, I²C, USB, Ethernet
      • for vision systems: MIPI, LVDS, Camera Link, HDMI
    • Hardware related Software development
      • Development of bare metal applications for ARM Cortex, MicroBlaze, Nios, LEON3 (SPARC architecture) in C or C++
Side Competencies
    • Software Development
      • Embedded Linux for the implementation of host functions in complete systems
      • Use of NVIDIA Jetson series for embedded software execution and GPU acceleration of image processing and specific algorithms using CUDA
      • Computer graphics and visualization in embedded systems using OpenGL ES
      • Application development for host systems in C++ or C# using MS Visual Studio or GCC
    • Programming environments
      • MATLAB, Python for the development, simulation and evaluation of innovative algorithms
Publications
White Paper
Markus Jäger, Xavier Berthelon
3D point cloud and depth map reconstruction with a monocular liquid lens optical system

April 2023

Journal article

Markus Jäger, Tilo Reinert

A digitizer based compact digital spectrometer for ion beam analysis using field programmable gate arrays and various energy algorithms

Review of Scientific Instruments 84 (8), 085105 (2013)

Journal article

Markus Jäger, TilmanButz

FPGA implementation of digital constant fraction algorithm with fractional delay for optimal time resolution

Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment Volume 674, Pages 24-27 (2012)
Journal article

Markus Jäger, TilmanButz

Perturbed Angular Correlation of the stretched cascade in the decay of 180mHf using a digital spectrometer
Hyperfine Interactions Volume 211, Pages 165–172 (2012)
Journal article
Markus Jäger, Kornelius Iwig, Tilman Butz

A compact digital time differential perturbed angular correlation-spectrometer using field programmable gate arrays and various timestamp algorithms

Review of Scientific Instruments 82, 065105 (2011)

Journal article
Markus Jäger, Kornelius Iwig, Tilman Butz

A user-friendly fully digital TDPAC-spectrometer

Hyperfine Interactions Volume 198, Pages 167–172 (2010)
Patents
Method for correcting a color reproduction of a digital microscope and digital microscope
Patent issued: Feb 18, 2020; Patent number: US10567719B2

A method for correcting colors of a color reproduction of a digital microscope and a digital microscope are described. In a first step of a method according to the invention, a color image of a sample that is to be examined under the microscope is recorded. When the recording is performed, wavelength-dependent properties of a microscope illumination unit that illuminates the sample are determined in order to describe a state of the microscope illumination unit, in that settings selected at the microscope illumination unit are captured. A set of correction values is determined, which is associated with a state of the microscope illumination unit that is selected in accordance with the state of the microscope illumination unit determined when the recording is performed. In a further step, the colors of the recorded color image of the sample are corrected by applying the correction values of the previously determined set.

MICROSCOPE
Patent issued: Feb 19, 2015; Patent number: US20150049180A1

Provided is a microscope comprising a recording unit, having a magnifying imaging optical unit and an image module, for recording images of a sample with a first image frequency and a digital evaluation unit, to which the recorded images are supplied and which carries out predetermined image processing based on the recorded images and produces, as a result, output images with a second image frequency that is smaller than the first image frequency or equal to the first image frequency and can transfer them to an output unit for representation.